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HCS00MS

Intersil Corporation
Part Number HCS00MS
Manufacturer Intersil Corporation
Description Radiation Hardened Quad 2-Input NAND Gate
Published Mar 23, 2005
Detailed Description HCS00MS August 1995 Radiation Hardened Quad 2-Input NAND Gate Pinouts 14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (...
Datasheet PDF File HCS00MS PDF File

HCS00MS
HCS00MS

Overview
HCS00MS August 1995 Radiation Hardened Quad 2-Input NAND Gate Pinouts 14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T14 TOP VIEW A1 1 B1 2 Y1 3 A2 4 B2 5 Y2 6 GND 7 14 VCC 13 B4 12 A4 11 Y4 10 B3 9 A3 8 Y3 Features • 3 Micron Radiation Hardened SOS CMOS • Total Dose 200K RAD (Si) • SEP Effective LET No Upsets: >100 MEV-cm2/mg • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/Bit-Day (Typ) • Dose Rate Survivability: >1 x 1012 RAD (Si)/s • Dose Rate Upset >1010 RAD (Si)/s 20ns Pulse • Cosmic Ray Upset Immunity < 2 x 10-9 Errors/Gate Day (Typ) • Latch-Up Free Under Any Conditions • Military Temperature Range: -55oC to +125oC • Significant Power Reduction Compared to LSTTL ICs • DC Operating Voltage Range: 4.
5V to 5.
5V • Input Logic Levels - VIL = 30% of VCC Max - VIH = 70% of VCC Min • Input Current Levels Ii ≤ 5µA at VOL, VOH 14 LEAD CERAMIC METAL SEAL FLATPACK PACKAGE (FLATPACK) MIL-STD-1835 CDFP3-F14 TOP VIEW A1 B1 Y1 1 2 3 4 5 6 7 14 13 12 11 10 9 8 ...


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