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HCTS30MS

Part Number	HCTS30MS
Manufacturer	Intersil Corporation
Description	Radiation Hardened 8-Input NAND Gate
Published	Mar 23, 2005
Detailed Description	HCTS30MS August 1995 Radiation Hardened 8-Input NAND Gate Pinouts 14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDI...
Datasheet	HCTS30MS PDF File

Overview

HCTS30MS August 1995 Radiation Hardened 8-Input NAND Gate Pinouts 14 LEAD CERAMIC DUAL-IN-LINE METAL SEAL PACKAGE (SBDIP) MIL-STD-1835 CDIP2-T14 TOP VIEW A 1 B 2 C 3 D 4 E 5 F 6 GND 7 14 VCC 13 NC 12 H 11 G 10 NC 9 NC 8 Y Features • 3 Micron Radiation Hardened SOS CMOS • Total Dose 200K RAD (Si) • SEP Effective LET No Upsets: >100 MEV-cm2/mg • Single Event Upset (SEU) Immunity < 2 x 10-9 Errors/ Bit-Day (Typ) • Dose Rate Survivability: >1 x • Dose Rate Upset >10 10 1012 RAD (Si)/s RAD (Si)/s 20ns Pulse • Latch-Up Free Under Any Conditions • Military Temperature Range: -55oC to +125oC • Signiﬁcant Power Reduction Compared to LSTTL ICs • DC Operating Voltage Range: 4.
5V to 5.
5V • LSTTL I...

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HCTS30MS Radiation Hardened 8-Input NAND Gate - Intersil Corporation

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