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LV56351JA

ON Semiconductor
Part Number LV56351JA
Manufacturer ON Semiconductor
Description 1ch DC/DC boost converter
Published Feb 10, 2016
Detailed Description Ordering number : ENA2001 LV56351JA Bi-CMOS IC 1ch DC/DC boost converter http://onsemi.com Overview LV56351JA integra...
Datasheet PDF File LV56351JA PDF File

LV56351JA
LV56351JA

Overview
Ordering number : ENA2001 LV56351JA Bi-CMOS IC 1ch DC/DC boost converter http://onsemi.
com Overview LV56351JA integrates 1ch DC/DC boost converter and 1ch LDO.
It is suitable as the power supply for BS/CS antennas of LCD/PDP TV and BD recorders that require automatic recovery without IC destruction and malfunction when the output is short-circuited.
Functions DC/DC boost converter • Soft-start time: 2.
8ms • Frequency 425kHz operation • Pulse by pulse over current limiter • Short circuit protector (SCP) LDO • Over current limiter (Fold back) All • Under voltage lockout • Thermal shutdown protector • Power good Specifications Maximum Ratings at Ta = 25°C Parameter Symbol Conditions Ratings Unit VCC maximum supply voltage LDOIN maximum input voltage SW maximum voltage Allowable power dissipation VCC max VLDOIN VSW Pd max *1 -0.
3 to 25 -0.
3 to 30 -0.
3 to 30 1.
1 V V V W Operating temperature Topr -30 to 85 °C Operating junction temperature Tjopr -30 to 125 °C Storage temperature Tstg -40 to 150 °C Allowable pin voltage VCC, EN SW, LDOIN, LDOOUT IN1, IN2, FB, SCP, PGOOD, DDCTL 25 V 30 V 6V *1: When mounted on the specified printed circuit board (32mm × 38mm × 1.
6mm), glass epoxy, double side board Caution 1) Absolute maximum ratings represent the value which cannot be exceeded for any length of time.
Caution 2) Even when the device is used within the range of absolute maximum ratings, as a result of continuous usage under high temperature, high current, high voltage, or drastic temperature change, the reliability of the IC may be degraded.
Please contact us for the further details.
Stresses exceeding Maximum Ratings may damage the device.
Maximum Ratings are stress ratings only.
Functional operation above the Recommended Operating Conditions is not implied.
Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability.
Semiconductor Components Industries, LLC, 2013 August, 2013 20112 SY 20111129-S0...


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