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7130-1

Holtek
Part Number 7130-1
Manufacturer Holtek
Description 30mA Low Power LDO
Published Mar 7, 2016
Detailed Description 30mA Low Power LDO Features · Low power consumption · Low voltage drop · Low temperature coefficient · High input volt...
Datasheet PDF File 7130-1 PDF File

7130-1
7130-1


Overview
30mA Low Power LDO Features · Low power consumption · Low voltage drop · Low temperature coefficient · High input voltage (up to +18V) · Output voltage accuracy: tolerance ±2% · TO-92, SOT-89 and SOT-25 package Applications · Battery-powered equipment · Communication equipment · Audio/Video equipment General Description The 71XX-1 series is a set of three-terminal low power high voltage regulators implemented in CMOS technology.
They allow input voltages as high as 24V.
They are available with several fixed output voltages ranging from 3.
0V to 5.
0V.
CMOS technology ensures low voltage drop and low quiescent current.
Selection Table Although designed primarily as fixed voltage regulators, these devices can be used with external components to obtain variable voltages and currents.
Part No.
Output Voltage Package Marking 7130-1 3.
0V 7133-1 7136-1 7144-1 3.
3V 3.
6V 4.
4V TO-92 SOT-89 SOT-25 71XXA-1 (for TO-92) 71XX-1 (for SOT-89) 1XX1 (for SOT-25) 7150-1 5.
0V Note: ²XX² stands for output voltages.
Block Diagram V IN V O U T V re f GND 1 Pin Assignment T O -9 2 S O T -8 9 7 1 X X A -1 F r o n t V ie w 7 1 X X -1 G N D V IN V O U T G N D V IN V O U T S O T -2 5 NC NC 1 X X 1 T o p V ie w G N D V IN V O U T B o tto m V ie w G N D V IN V O U T G N D V IN V O U T Absolute Maximum Ratings Supply Voltage .
-0.
3V to 26V Power Consumption (*1) .
.
.
.
200mW Power Consumption (*2) 150mW Storage Temperature .
.
-50°C to 125°C Operating Temperature .
-40°C to 85°C Note: These are stress ratings only.
Stresses exceeding the range specified under ²Absolute Maximum Ratings² may cause substantial damage to the device.
Functional operation of this device at other conditions beyond those listed in the specification is not implied and prolonged exposure to extreme conditions may affect device reliability.
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