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SSTE32882KA1 Datasheet PDF

Part Number SSTE32882KA1
Description 1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER
Manufacture IDT
Total Page 30 Pages
PDF Download Download SSTE32882KA1 Datasheet PDF

Features: Datasheet pdf DATASHEET 1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT SSTE32882KA1 Description This 28-bit 1:2, or 26-bit 1:2 and 4-bi t 1:1, registering clock driver with pa rity is designed for 1.25V, 1.35V and 1 .5V VDD operation. All inputs are 1.25, 1.35V and 1.5V CMOS compatible, except the reset (RESET) and MIRROR inputs whi ch are LVCMOS. All outputs are 1.25V,1. 35V and 1.5V CMOS edge-controlled drive rs optimized to drive single terminated 25Ω to 50Ω traces in DDR3 RDIMM appl ications, except the open-drain error ( ERROUT) output. The clock outputs (Yn a nd Yn) and control net outputs QnCKEn, QnCSn and QnODTn are designed with a di fferent strength and skew to compensate for different loading and equalize sig nal travel speed. The SSTE32882KA1 has two basic modes of operation associated with the Quad Chip Select Enable (QCSE N) input. When the QCSEN input pin is o pen (or pulled high), the component has two chip select inputs, DCS0 and DCS1, and two copies of each .

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SSTE32882KA1 datasheet
DATASHEET
1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY
TEST AND QUAD CHIP SELECT
SSTE32882KA1
Description
This 28-bit 1:2, or 26-bit 1:2 and 4-bit 1:1, registering clock
driver with parity is designed for 1.25V, 1.35V and 1.5V VDD
operation.
All inputs are 1.25,1.35V and 1.5V CMOS compatible, except the
reset (RESET) and MIRROR inputs which are LVCMOS. All
outputs are 1.25V,1.35V and 1.5V CMOS edge-controlled drivers
optimized to drive single terminated 25Ω to 50Ω traces in DDR3
RDIMM applications, except the open-drain error (ERROUT)
output. The clock outputs (Yn and Yn) and control net outputs
QnCKEn, QnCSn and QnODTn are designed with a different
strength and skew to compensate for different loading and
equalize signal travel speed.
The SSTE32882KA1 has two basic modes of operation
associated with the Quad Chip Select Enable (QCSEN) input.
When the QCSEN input pin is open (or pulled high), the
component has two chip select inputs, DCS0 and DCS1, and two
copies of each chip select output, QACS0, QACS1, QBCS0 and
QBCS1. This is the "QuadCS disabled" mode. When the
QCSEN input pin is pulled low, the component has four chip
select inputs DCS[3:0], and four chip select outputs, QCS[3:0].
This is the "QuadCS enabled" mode. Through the remainder of
this specification, DCS[n:0] will indicate all of the chip select
inputs, where n=1 for QuadCS disabled, and n=3 for QuadCS
enabled. QxCS[n:0] will indicate all of the chip select outputs.
DRAS, DCAS, and DWE), and indicates whether a parity error
has occurred on the open-drain ERROUT pin (active low). The
convention is even parity; i.e., valid parity is defined as an even
number of ones across the DIMM-independent data inputs
combined with the parity input bit. To calculate parity, all
DIMM-independent D-inputs must be tied to a known logic state.
The DIMM-dependent signals (DCKEn, DODTn, and DCSn) are
not included in the parity check computation.
To ensure defined outputs from the register before a stable clock
has been supplied, RESET must be held in the low state during
power-up.
The SSTE32882KA1 is available in a 176-ball BGA with
0.65mm ball pitch in a 11 x 20 grid. The device pinout supports
outputs on the outer two left and right columns to support easy
DIMM signal routing. Corresponding inputs are placed in a-way
that two devices can be placed back-to-back for four Rank
modules while the data inputs share the same vias. Each input and
output is located close to an associated no ball position or on the
outer two rows to allow low cost via technology combined with
the small 0.65mm ball pitch.
The SSTE32882KA1 includes a high-performance, low-jitter,
low-skew buffer that distributes a differential clock input (CK
and CK) to four differential pairs of clock outputs (Yn and Yn),
and to one differential pair of feedback clock outputs (FBOUT
and FBOUT). The clock outputs are controlled by the input
clocks (CK and CK), the feedback clocks (FBIN and FBIN), and
the analog power inputs (AVDD and AVSS). When AVDD is
grounded, the PLL is turned off and bypassed for test purposes.
The SSTE32882KA1 operates from a differential clock (CK and
CK). Data are registered at the crossing of CK going high, and
CK going low. The data is either driven to the corresponding
device outputs if exactly one of the DCS[n:0] input signals is
driven low.
Based on the control register settings, the device can change its
output characterisitics to match different DIMM net topologies.
The timing can be changed to compensate for different flight time
of signals within the target application. By disabling unused
outputs the power consumption is reduced.
The SSTE32882KA1 accepts a parity bit from the memory
controller on the parity (PAR_IN) input, compares it with the data
received on the DIMM-independent data inputs (DAn, DBAn,
1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT
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SSTE32882KA1
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SSTE32882KA1 datasheet
SSTE32882KA1
1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT
COMMERCIAL TEMPERATURE RANGE
Features
Pinout optimizes DDR3 RDIMM PCB layout
DDR3-800/1066/1333/1600/1866/2133 rate
1-to-2 Register Outputs and 1-to-4 Clock Pair Outputs support stacked DDR3 RDIMMs
Phase Lock Loop clock driver for buffering one differential clock pair (CK and CK) and distributing to four differential outputs
Supports LVCMOS switching levels on the RESET and MIRROR inputs
Checks priority on DIMM-independent data inputs
Supports dynamic 1T/3T timing transaction and output inversion feature for improved timing performance during normal operations
and MRS command pass-through
Supports CKE Power Down operation modes
Supports Quad Chip Select operation features
RESET input disables differential input recievers, resets all registers, and disables all output drivers except ERROUT and QnCKEn
Provides access to internal control words for configuring the device features and adapting in different RDIMM and system
applications
Latch-up performance exceeds 100mA
ESD > 2000V per MIL-STD883, Method 3015; ESD > 200V using machine model (c = 200pF, R = 0)
Available in 176 Ball Grid Array package
1.25V/1.35V/1.5V REGISTERING CLOCK DRIVER WITH PARITY TEST AND QUAD CHIP SELECT
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SSTE32882KA1
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