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TC74AC00F

Toshiba
Part Number TC74AC00F
Manufacturer Toshiba
Description Quad 2-Input NAND Gate
Published Jan 21, 2021
Detailed Description CMOS Digital Integrated Circuits Silicon Monolithic TC74AC00F TC74AC00F 1. Functional Description • Quad 2-Input NAND ...
Datasheet PDF File TC74AC00F PDF File

TC74AC00F
TC74AC00F

Overview
CMOS Digital Integrated Circuits Silicon Monolithic TC74AC00F TC74AC00F 1.
Functional Description • Quad 2-Input NAND Gate 2.
General The TC74AC00F is an advanced high speed CMOS 2-INPUT NAND GATE fabricated with silicon gate and double-layer metal wiring C2MOS technology.
It achieves the high speed operation similar to equivalent Bipolar Schottky TTL while maintaining the CMOS low power dissipation.
The internal circuit is composed of 3 stages including buffer output, which provide high noise immunity and stable output.
All inputs are equipped with protection circuits against static discharge or transient excess voltage.
3.
Features (1) High speed: tpd = 3.
8 ns (typ.
) VCC = 5.
0 V (2) Low power dissipation: ICC = 4.
0 µA (max) Ta = 25  (3) High noise immunity: VNIH = VNIL = 28 % VCC (min) (4) Output current: |IOH|/IOL = 24 mA (min) (VCC = 4.
5 V) (5) Balanced propagation delays: tPLH ≈ tPHL (6) Wide operating voltage range: VCC(opr) = 2.
0 V to 5.
5 V (7) Pin and function compatible with 74F00.
4.
Packaging SOP14 ©2020 Toshiba Electronic Devices & Storage Corporation 1 Start of commercial production 1986-05 2020-02-18 Rev.
1.
0 5.
Pin Assignment 6.
Marking 7.
IEC Logic Symbol TC74AC00F ©2020 Toshiba Electronic Devices & Storage Corporation 2 2020-02-18 Rev.
1.
0 8.
Truth Table TC74AC00F A B Y L L H L H H H L H H H L 9.
Absolute Maximum Ratings (Note) Characteristics Symbol Rating Unit Supply voltage VCC -0.
5 to 7.
0 V Input voltage VIN -0.
5 to VCC + 0.
5 V Output voltage VOUT -0.
5 to VCC + 0.
5 V Input diode current IIK ±20 mA Output diode current IOK ±50 mA Output current IOUT ±50 mA VCC/ground current ICC ±100 mA Power dissipation PD 180 mW Storage temperature Tstg -65 to 150  Note: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction.
Using continuously under heavy loads (e.
g.
the application of high temperature/current/voltage and the...


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