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HYB39S16160CT-6

Siemens Semiconductor
Part Number HYB39S16160CT-6
Manufacturer Siemens Semiconductor
Description 1M x 16 MBit Synchronous DRAM
Published Apr 10, 2010
Detailed Description www.DataSheet4U.com HYB39S16160CT-6/-7 16MBit Synchronous DRAM 1M x 16 MBit Synchronous DRAM for High Speed Graphics Ap...
Datasheet PDF File HYB39S16160CT-6 PDF File

HYB39S16160CT-6
HYB39S16160CT-6


Overview
www.
DataSheet4U.
com HYB39S16160CT-6/-7 16MBit Synchronous DRAM 1M x 16 MBit Synchronous DRAM for High Speed Graphics Applications • High Performance: -6 fCKmax @ CL=3 tCK3 tAC3 fCKmax @ CL=2 tCK2 tAC2 166 6 5 125 8 6 -7 143 7 5.
5 115 9 6 Units MHz ns ns MHz ns ns • • • • • • • • full page(optional) for sequencial wrap around Multiple Burst Read with Single Write Operation Automatic Command and Controlled Precharge Data Mask for Read / Write control Dual Data Mask for byte control ( x16) Auto Refresh (CBR) and Self Refresh Suspend Mode and Power Down Mode 4096 refresh cycles / 64 ms Latency 2 @ 125 MHz Latency 3 @ 166 MHz Random Column Address every CLK ( 1-N Rule) Single 3.
3V +/- 0.
3V Power Supply LVTTL Interface Plastic Packages: P-TSOPII-50 400mil width ( x16 ) • • • • • • Fully Synchronous to Positive Clock Edge 0 to 70 °C operating temperature Dual Banks controlled by A11 ( Bank Select) Programmable CAS Latency : 2, 3 Programmable Wrap Sequence : Sequential or Interleave Programmable Burst Length: 1, 2, 4, 8 • • • • • • The HYB39S16160CT-6/-7 are high speed dual bank Synchronous DRAM’s based on SIEMENS 0.
25µm process and organized as 2 banks x 512kbit x 16.
These synchronous devices achieve high speed data transfer rates up to 166 MHz by employing a chip architecture that prefetches multiple bits and then synchronizes the output data to a system clock.
The chip is fabricated with SIEMENS’ advanced 16MBit DRAM process technology.
The device is designed to comply with all JEDEC standards set for synchronous DRAM products, both electrically and mechanically.
All of the control, address, data input and output circuits are synchronized with the positive edge of an externally supplied clock.
Operating the two memory banks in an interleaved fashion allows random access operation to occur at higher rate than is possible with standard DRAMs.
A sequential and gapless data rate of up to 166 MHz is possible depending on burst length, CAS latency and speed grade of...



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